发明名称 |
NAND STRING CONTAINING SELF-ALIGNED CONTROL GATE SIDEWALL CLADDING |
摘要 |
A method of making a NAND string includes forming a tunnel dielectric over a semiconductor channel, forming a charge storage layer over the tunnel dielectric, forming a blocking dielectric over the charge storage layer, and forming a control gate layer over the blocking dielectric. The method also includes patterning the control gate layer to form a plurality of control gates separated by trenches, and reacting a first material with exposed sidewalls of the plurality of control gates to form self aligned metal-first material compound sidewall spacers on the exposed sidewalls of the plurality of control gates. |
申请公布号 |
US2015137208(A1) |
申请公布日期 |
2015.05.21 |
申请号 |
US201514607339 |
申请日期 |
2015.01.28 |
申请人 |
SANDISK TECHNOLOGIES INC. |
发明人 |
Lee Donovan;Purayath Vinod;Kai James;Matamis George |
分类号 |
H01L27/115;H01L29/423 |
主分类号 |
H01L27/115 |
代理机构 |
|
代理人 |
|
主权项 |
1. A NAND string, comprising:
a semiconductor channel; a tunnel dielectric located over a semiconductor channel; a plurality of floating gates separated by trenches located over the tunnel dielectric; a plurality of blocking dielectric regions separated by the trenches, each of the plurality of blocking dielectric regions is located over at least a respective one of the plurality of floating gates; a plurality of control gates separated by the trenches, each of the plurality of control gates is located over a respective one of the plurality of blocking dielectric regions; and a plurality of metal-first material compound sidewall spacers located on sidewalls of the plurality of control gates; wherein the sidewall spacers protrude into the trenches beyond sidewalls of respective floating gates located under the control gates. |
地址 |
Plano TX US |