发明名称 |
Gate Protection Caps and Method of Forming the Same |
摘要 |
A structure includes a substrate, a gate structure over the substrate, a dielectric layer over the substrate, and a cap over a gate electrode of the gate structure. Top surfaces of the dielectric layer and gate electrode are co-planar. The gate structure extends a gate lateral distance between first and second gate structure sidewalls. The cap extends between first and second cap sidewalls. A first cap portion extends from a midline of the gate structure laterally towards the first gate structure sidewall and to the first cap sidewall a first cap lateral distance, and a second cap portion extends from the midline laterally towards the second gate structure sidewall and to the second cap sidewall a second cap lateral distance. The first cap lateral distance and the second cap lateral distance are at least half of the gate lateral distance. |
申请公布号 |
US2015137195(A1) |
申请公布日期 |
2015.05.21 |
申请号 |
US201314084420 |
申请日期 |
2013.11.19 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Lin Chih-Han;Lin Jr-Jung;Chang Ming-Ching;Chen Chao-Cheng |
分类号 |
H01L29/423;H01L21/28 |
主分类号 |
H01L29/423 |
代理机构 |
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代理人 |
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主权项 |
1. A structure comprising:
a substrate; a gate structure over the substrate, the gate structure comprising a gate electrode and a gate dielectric, the gate structure extending laterally a gate lateral distance between a first gate structure sidewall and a second gate structure sidewall; a first dielectric layer over the substrate, a top surface of the first dielectric layer being co-planar with a top surface of the gate electrode; and a gate protection cap over the gate electrode, the gate protection cap extending laterally between a first cap sidewall and a second cap sidewall, a first cap portion extending from a midline of the gate structure laterally towards the first gate structure sidewall and to the first cap sidewall a first cap lateral distance, a second cap portion extending from the midline laterally towards the second gate structure sidewall and to the second cap sidewall a second cap lateral distance, the first cap lateral distance and the second cap lateral distance being at least half of the gate lateral distance. |
地址 |
Hsin-Chu TW |