发明名称 Gate Protection Caps and Method of Forming the Same
摘要 A structure includes a substrate, a gate structure over the substrate, a dielectric layer over the substrate, and a cap over a gate electrode of the gate structure. Top surfaces of the dielectric layer and gate electrode are co-planar. The gate structure extends a gate lateral distance between first and second gate structure sidewalls. The cap extends between first and second cap sidewalls. A first cap portion extends from a midline of the gate structure laterally towards the first gate structure sidewall and to the first cap sidewall a first cap lateral distance, and a second cap portion extends from the midline laterally towards the second gate structure sidewall and to the second cap sidewall a second cap lateral distance. The first cap lateral distance and the second cap lateral distance are at least half of the gate lateral distance.
申请公布号 US2015137195(A1) 申请公布日期 2015.05.21
申请号 US201314084420 申请日期 2013.11.19
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Lin Chih-Han;Lin Jr-Jung;Chang Ming-Ching;Chen Chao-Cheng
分类号 H01L29/423;H01L21/28 主分类号 H01L29/423
代理机构 代理人
主权项 1. A structure comprising: a substrate; a gate structure over the substrate, the gate structure comprising a gate electrode and a gate dielectric, the gate structure extending laterally a gate lateral distance between a first gate structure sidewall and a second gate structure sidewall; a first dielectric layer over the substrate, a top surface of the first dielectric layer being co-planar with a top surface of the gate electrode; and a gate protection cap over the gate electrode, the gate protection cap extending laterally between a first cap sidewall and a second cap sidewall, a first cap portion extending from a midline of the gate structure laterally towards the first gate structure sidewall and to the first cap sidewall a first cap lateral distance, a second cap portion extending from the midline laterally towards the second gate structure sidewall and to the second cap sidewall a second cap lateral distance, the first cap lateral distance and the second cap lateral distance being at least half of the gate lateral distance.
地址 Hsin-Chu TW