QUANTUM DOT-LABELED TEST STRIP CARD

摘要

A quantum dot-labeled test strip card comprising a card case (3) and a quantum dot-labeled test strip (2). One extremity of the card case (3) is opened to form a test strip insertion groove opening (13). The test strip (2) is a detachable-pluggable structure of the card case (3). Mounted onto the card case (3) is a storage medium (14) having stored information such as a sample tested-material standard curve. When testing a sample, one extremity of a sample absorbing pad (4) of the test strip (2) inserted into the card case (3) is interference extended out of the opened extremity of the card case (3) to be immersed in the sample to absorb same, and then, characteristic signals of a testing strip (6) and of a quality control strip (7) of the test strip (2) are collected by an instrument having a signal detection function and are combined with the tested-material standard curve or coefficient parameters read simultaneously by the instrument from the storage medium (14) to acquire by calculation the concentration of a single component or multiple components of the sample. The test strip card provides sample testing with the advantages of simplicity and rapidness, great flexibility, objective result, and flexible use.