发明名称 MEASUREMENT CUPON FOR MULTI-LAYER ADJUSTMENT DEGREE OF BUILD-UP PCB
摘要 According to the present invention, ring-shaped circular circuits are formed on the upper and the lower sides of an insulation layer at the center of a build-up substrate in order to quickly check with the naked eye the interlayer adjustment degree of the build-up substrate through a coupon. An adjustment hole is vertically formed through the insulation layer which is at the center of the circular circuit.
申请公布号 KR20150055348(A) 申请公布日期 2015.05.21
申请号 KR20130137576 申请日期 2013.11.13
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 SHIN, GIL YONG
分类号 H05K3/46 主分类号 H05K3/46
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