发明名称 |
MEASUREMENT CUPON FOR MULTI-LAYER ADJUSTMENT DEGREE OF BUILD-UP PCB |
摘要 |
According to the present invention, ring-shaped circular circuits are formed on the upper and the lower sides of an insulation layer at the center of a build-up substrate in order to quickly check with the naked eye the interlayer adjustment degree of the build-up substrate through a coupon. An adjustment hole is vertically formed through the insulation layer which is at the center of the circular circuit. |
申请公布号 |
KR20150055348(A) |
申请公布日期 |
2015.05.21 |
申请号 |
KR20130137576 |
申请日期 |
2013.11.13 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
SHIN, GIL YONG |
分类号 |
H05K3/46 |
主分类号 |
H05K3/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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