发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To achieve a structure which is hard to be broken by an external force applied to a solder bump by achieving structural reinforcement of an opening periphery which abuts the solder bump even when a semiconductor process is increasingly miniaturized in a semiconductor integrated circuit where electrical connection with an electric circuit board of a connection destination is performed by the solder bump preliminarily attached to a chip.SOLUTION: A semiconductor integrated circuit 1 has a structure in which an insulation layer 18 arranged on a lower layer side comes in contact with another insulation layer 22 which composes a solder bump connection surface 25 on an inner side of an outer peripheral side periphery of the solder bump connection surface 25 and along a substrate surface direction of a semiconductor substrate 2, from the lower layer side along a substrate thickness direction of the semiconductor substrate 2.
申请公布号 JP2015097244(A) 申请公布日期 2015.05.21
申请号 JP20130237361 申请日期 2013.11.15
申请人 HITACHI AUTOMOTIVE SYSTEMS LTD 发明人 ANDO RYO;HANZAWA KEIJI
分类号 H01L21/60 主分类号 H01L21/60
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