发明名称 窒化物半導体装置
摘要 <p>A nitride semiconductor device includes a semiconductor substrate and a nitride semiconductor layer disposed on the semiconductor substrate. The semiconductor substrate includes a normal region, a carrier supplying region, and an interface current blocking region. The interface current blocking region surrounds the normal region and the carrier supplying region. The interface current blocking region and the carrier supplying region include impurities. The carrier supplying region has a conductivity type allowing the carrier supplying region to serve as a source of carriers supplied to or a destination of carriers supplied from a carrier layer generated at an interface between the nitride semiconductor layer and the semiconductor substrate. The interface current blocking region has a conductivity type allowing the interface current blocking region to serve as a potential barrier to the carriers.</p>
申请公布号 JP5720000(B2) 申请公布日期 2015.05.20
申请号 JP20130500709 申请日期 2011.07.26
申请人 发明人
分类号 H01L21/338;H01L21/28;H01L29/41;H01L29/47;H01L29/778;H01L29/812;H01L29/872 主分类号 H01L21/338
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