JIG FOR LOADING SAMPLES ON IN-SITU TIP

摘要

The present invention relates to a jig used for transmission electron microscopes. A jig according to the present invention comprises: a base unit which includes an upper board portion having a combination hole, and a leg portion supporting the upper board portion; and a support fixture vertically combined to the upper board portion with its lower portion being inserted to the combination hole, and the in-situ hat connected with in-situ tip, being combined to the upper portion. According to the present invention, various in-situ experiments can be implemented by loading samples on the in-situ tip.