发明名称 DAMPED EGT PROBE
摘要 <p>A temperature probe includes a flange, a support structure, thermocouple wires, and guide plates. The flange has a midline. The support structure is attached to the midline and extends away from the flange. The thermocouple wires extend along the support structure, and terminate in a set of outer sensing tips and a set of inner sensing tips. The guide plates secure the thermocouple wires to the support structure. The guide plates are offset laterally from the midline of the flange.</p>
申请公布号 EP2872861(A1) 申请公布日期 2015.05.20
申请号 EP20130819980 申请日期 2013.07.16
申请人 UNITED TECHNOLOGIES CORPORATION 发明人 GREENBERG, MICHAEL D.;SPENCE, RYAN;KELLY, WILLIAM T.;DE LORME, JOSEPH;MC LARTY, BOBBY J.
分类号 G01K1/14;F02C7/00;F02C9/00;G01K13/02 主分类号 G01K1/14
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