发明名称 |
DAMPED EGT PROBE |
摘要 |
<p>A temperature probe includes a flange, a support structure, thermocouple wires, and guide plates. The flange has a midline. The support structure is attached to the midline and extends away from the flange. The thermocouple wires extend along the support structure, and terminate in a set of outer sensing tips and a set of inner sensing tips. The guide plates secure the thermocouple wires to the support structure. The guide plates are offset laterally from the midline of the flange.</p> |
申请公布号 |
EP2872861(A1) |
申请公布日期 |
2015.05.20 |
申请号 |
EP20130819980 |
申请日期 |
2013.07.16 |
申请人 |
UNITED TECHNOLOGIES CORPORATION |
发明人 |
GREENBERG, MICHAEL D.;SPENCE, RYAN;KELLY, WILLIAM T.;DE LORME, JOSEPH;MC LARTY, BOBBY J. |
分类号 |
G01K1/14;F02C7/00;F02C9/00;G01K13/02 |
主分类号 |
G01K1/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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