发明名称 トレンチポリシリコンダイオード
摘要 <p>Embodiments of the present invention include a method of manufacturing a trench transistor. The method includes forming a substrate of a first conductivity type and implanting a dopant of a second conductivity type, forming a body region of the substrate. The method further includes forming a trench in the body region and depositing an insulating layer in the trench and over the body region wherein the insulating layer lines the trench. The method further includes filling the trench with polysilicon forming a top surface of the trench and forming a diode in the body region wherein a portion of the diode is lower than the top surface of the trench.</p>
申请公布号 JP5721674(B2) 申请公布日期 2015.05.20
申请号 JP20120194777 申请日期 2012.09.05
申请人 发明人
分类号 H01L21/329;H01L21/822;H01L27/04;H01L27/06;H01L29/86;H01L29/866 主分类号 H01L21/329
代理机构 代理人
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