发明名称 APPARATUS FOR CLAMPING SPECIMEN
摘要 An apparatus for clamping specimen is provided to make it easy to analyze the cross-section of a specimen for analysis and to clamp the specimen for analysis. The apparatus for clamping a specimen for analysis according to an embodiments of the present invention comprises: a gripping unit that places a specimen for the cross-section of the specimen for analysis to face at an angle that can be analyzed; a pressure adjusting unit that moves the position of the gripping unit by rotation for the gripping unit to pressurize the specimen; and a support unit that supports the pressure adjusting unit to guide the movement of the pressure adjusting unit according to the rotation of the pressure adjusting unit.
申请公布号 KR20150054256(A) 申请公布日期 2015.05.20
申请号 KR20130136470 申请日期 2013.11.11
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 LIM, SUNG HEE;JEON, JI EUN;YOON, HYO JIN;HAM, SUK JIN
分类号 G01N1/36 主分类号 G01N1/36
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