发明名称 Three-dimensional shape measurement method and three-dimensional shape measurement device
摘要 This three-dimensional shape measurement method comprises: a projection step for projecting an interference fringe pattern (F) having a single spatial frequency (fi) onto an object surface; a recording step for recording the pattern (F) as a digital hologram; and a measurement step for generating a plurality of reconstructed images having different focal distances from the hologram, and deriving the distance to each point on the object surface by applying a focusing method to the pattern (F) on each of the reconstructed images. The measurement step extracts the component of the single spatial frequency (fi) corresponding to the pattern (F) from each of the reconstructed images by spatial frequency filtering, upon applying the focusing method, and makes it possible to achieve a highly accurate measurement in which the adverse effect of speckles is reduced and the advantage of a free-focus image reconstruction with holography is used effectively.
申请公布号 US9036900(B2) 申请公布日期 2015.05.19
申请号 US201213980775 申请日期 2012.01.19
申请人 University of Hyogo 发明人 Sato Kunihiro
分类号 G06K9/00;G06T7/60;G01B11/25;G03H1/04;G03H1/08;G03H1/00 主分类号 G06K9/00
代理机构 Crowell & Moring LLP 代理人 Crowell & Moring LLP
主权项 1. A method for measuring a three-dimensional shape comprising the steps of: a projection step for projecting an interference fringe pattern (F) having a single spatial frequency (fi) onto an object surface; a recording step for recording the interference fringe pattern (F) projected on the object surface by the projection step as a hologram using a photo detector; and a measurement step for generating a plurality of reconstructed images having different focal distances from the hologram recorded by the recording step, and deriving a distance to each point on the object surface by applying a focusing method to the interference fringe pattern (F) in each of the reconstructed images, wherein the measurement step comprises an interference fringe pattern extraction step for extracting a component of the single spatial frequency (fi) corresponding to the interference fringe pattern from each of the reconstructed images by spatial frequency filtering when the focusing method is applied.
地址 Kobe-shi JP