发明名称 System and method for measuring the thickness of a zinc layer on steel and for measuring the iron concentration in a zinc layer
摘要 A Compton radiation detection device for determining of Compton radiation of iron, includes a sensor and a filter arrangement. The filter arrangement is adapted such that the radiation emitted by a test object due to Compton scattering passes a nickel layer and an iron layer before being detected by the sensor. A dispersive ionization chamber includes an ionization chamber having a plurality off ionization volumes and a window. Each ionization volume includes an electrode. Radiation can enter through the window. The ionization volumes are arranged in a beam propagation direction behind each other. Radiation having lower energy is statistically absorbed in ionization volumes located more proximal to the window. Radiation having higher energy is statistically absorbed in the ionization volumes located more distal from the window.
申请公布号 US9036778(B2) 申请公布日期 2015.05.19
申请号 US201213533154 申请日期 2012.06.26
申请人 Rayonic Sensor System GmbH 发明人 Olszewski Rigobert;Helbig Peter;Ortner Hanns-Werner;Golz Karl-Heinz
分类号 G01N23/223;G01N23/20;G01N33/20;G01B15/02;G01N23/22 主分类号 G01N23/223
代理机构 Bockhop & Associates, LLC 代理人 Bockhop Bryan W.;Bockhop & Associates, LLC
主权项 1. An apparatus configured as a determining device, adapted to determine the thickness of a zinc layer on an iron layer of a test object and the iron content in the zinc layer on the iron layer of the test object, comprising: an x-ray source, emitting x-ray radiation to the test object having the zinc layer on the iron layer; a first fluorescence detection device determining a first fluorescence radiation due to iron in the test object scattered under a first angle segment from the test object; a Compton radiation detection device determining a Compton scattering based on iron in a test object scattered under a first angle segment from the test object, the Compton detection device including: an x-ray sensor; anda filter arrangement adapted such that the radiation emitted by a test object due to Compton scattering passes a nickel layer and an iron layer before being detected by the x-ray sensor; a second fluorescence detection device determining a second fluorescence radiation due to iron in the test object scattered in a second angle segment from the test object; a third fluorescence detection device determining a third fluorescence radiation due to iron in the test object scattered in the second angle segment from the test object; a first analyzing device adapted to determine the thickness of the zinc layer on the iron layer of the test object based on the first fluorescence radiation and the Compton radiation; and a second analyzing device adapted to determine the iron content in the zinc layer based on the first fluorescence radiation, the second fluorescence radiation and the third fluorescence radiation.
地址 Forchheim DE