发明名称 Thermal analyzer
摘要 A thermal analyzer (100) includes: a furnace tube (9) made of a transparent material; a heating furnace (3); a sample holding part (41, 42) arranged inside the furnace tube; a first support base (12); a second support base (14); a measurement chamber (30) connected to the furnace tube; a first movement part (22) for moving the first support base and the second support base between a measurement position, at which the furnace tube is connected to the measurement chamber, and a sample setting position, at which the sample holding part is exposed on a rear end side with respect to the furnace tube and the heating furnace; and a second movement part (24) for moving only the second support base to a sample observation position, at which the heating furnace is advanced and the furnace tube is exposed. Accordingly, the sample is observable from outside the exposed furnace tube.
申请公布号 US9033574(B2) 申请公布日期 2015.05.19
申请号 US201313777291 申请日期 2013.02.26
申请人 HITACHI HIGH-TECH SCIENCE CORPORATION 发明人 Nagasawa Kanji;Yamada Kentaro;Nishimura Shinya
分类号 G01N25/00;G01N25/02;G01N5/00 主分类号 G01N25/00
代理机构 Brinks Gilson & Lione 代理人 Brinks Gilson & Lione
主权项 1. A thermal analyzer, comprising: a furnace tube which is made of a transparent material and is formed into a cylindrical shape, the furnace tube having a gas discharge port which is reduced in diameter and is arranged at a tip end portion thereof in an axial direction; a heating furnace which has a cylindrical shape and externally surrounds the furnace tube; sample holding means for holding a sample, the sample holding means being arranged inside the furnace tube; a first support base; a second support base; a furnace tube fixing part for fixing a rear end portion of the furnace tube in the axial direction to the first support base; a heating furnace fixing part for fixing the heating furnace to the second support base; a measurement chamber which is hermetically connected to the rear end portion of the furnace tube; measurement means for measuring a change in physical properties of the sample, the measurement means being arranged inside the measurement chamber; first movement means for moving the first support base and the second support base between a measurement position, at which the rear end portion of the furnace tube is connected to the measurement chamber and the sample holding means is covered with the heating furnace, and a sample setting position, at which the furnace tube and the heating furnace are advanced toward a tip end side with respect to the measurement position and the sample holding means is exposed on a rear end side with respect to the furnace tube and the heating furnace; and second movement means for moving only the second support base to a sample observation position, at which the heating furnace is advanced toward the tip end side with respect to the measurement position under a state in which the rear end portion of the furnace tube is connected to the measurement chamber, and the furnace tube is exposed in a region including the sample holding means, the thermal analyzer being configured to enable observation of the sample from outside the exposed furnace tube at the sample observation position.
地址 Tokyo JP
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