Position independent testing of circuits

摘要

Scan distributor, collector, and controller circuitry connect to the functional inputs and outputs of core circuitry on integrated circuits to provide testing through those functional inputs and outputs. Multiplexer and demultiplexer circuits select between the scan circuitry and the functional inputs and outputs. The core circuitry can also be provided with built-in scan distributor, collector, and controller circuitry to avoid having to add it external of the core circuitry. With appropriately placed built-in scan distributor and collector circuits, connecting together the functional inputs and outputs of the core circuitry also connects together the scan distributor and collector circuitry in each core. This can provide a hierarchy of scan circuitry and reduce the need for separate test interconnects and multiplexers.

主权项

1. An integrated circuit comprising:
A. a data input lead; B. a data output lead; C. functional circuitry having a functional input formed of an input buffer circuit having an input connected to the data input lead and a control input, a functional output formed of an output buffer circuit having an output connected to the data output lead and a control input, and parallel scan paths, each scan path having a serial input; D. scan distributor circuitry having a serial input connected to the data input lead, a serial output, and parallel outputs connected to the serial inputs of the parallel scan paths; E. a distributor output buffer having an input connected to the serial output of the scan distributor circuitry, an output connected to the data output lead, and a control input that selectively disconnects the buffer input from the buffer output; and F. control circuitry having a serial input, and control outputs coupled to the control inputs.