发明名称 |
Thin-film transistor and zinc oxide-based sputtering target for the same |
摘要 |
A thin-film transistor includes a metal electrode and a zinc oxide-based barrier film that blocks a material from diffusing out of the metal electrode. The zinc oxide-based barrier film is made of zinc oxide doped with indium oxide, the content of the indium oxide ranging, by weight, 1 to 50 percent of the zinc oxide-based barrier film. A zinc oxide-based sputtering target for deposition of a barrier film of a thin-film transistor is made of zinc oxide doped with indium oxide, the content of the indium oxide ranging, by weight, 1 to 50 percent of the zinc oxide-based sputtering target. |
申请公布号 |
US9035297(B2) |
申请公布日期 |
2015.05.19 |
申请号 |
US201313931697 |
申请日期 |
2013.06.28 |
申请人 |
SAMSUNG CORNING PRECISION MATERIALS CO., LTD.;SAMSUNG DISPLAY CO., LTD.;SAMSUNG CORNING ADVANCED GLASS, LLC |
发明人 |
Park Jaewoo;Lee Yoon Gyu;Kim Do-Hyun;Kim Dongjo;Park Juok;Sohn Insung;Yoon Sangwon;Lee Gunhyo;Lee Yongjin;Jeon Woo-Seok |
分类号 |
H01L29/10;H01L29/12;H01L29/786;C23C14/34;C23C14/08;C23C14/00 |
主分类号 |
H01L29/10 |
代理机构 |
McDermott Will & Emery LLP |
代理人 |
McDermott Will & Emery LLP |
主权项 |
1. A thin-film transistor comprising: a metal electrode;
a zinc oxide-based barrier film comprising zinc oxide doped with indium oxide, and a content of the indium oxide ranges, by weight, from 1 to 50 percent of the zinc oxide-based barrier film; and
an oxide semiconductor layer,wherein the zinc oxide-based barrier film is disposed between the metal electrode and the oxide semiconductor layer and the barrier film blocks a material from diffusing out of the metal electrode and into the oxide semiconductor layer. |
地址 |
Gumi-si, Gyeongsangbuk-do KR |