发明名称 Thin-film transistor and zinc oxide-based sputtering target for the same
摘要 A thin-film transistor includes a metal electrode and a zinc oxide-based barrier film that blocks a material from diffusing out of the metal electrode. The zinc oxide-based barrier film is made of zinc oxide doped with indium oxide, the content of the indium oxide ranging, by weight, 1 to 50 percent of the zinc oxide-based barrier film. A zinc oxide-based sputtering target for deposition of a barrier film of a thin-film transistor is made of zinc oxide doped with indium oxide, the content of the indium oxide ranging, by weight, 1 to 50 percent of the zinc oxide-based sputtering target.
申请公布号 US9035297(B2) 申请公布日期 2015.05.19
申请号 US201313931697 申请日期 2013.06.28
申请人 SAMSUNG CORNING PRECISION MATERIALS CO., LTD.;SAMSUNG DISPLAY CO., LTD.;SAMSUNG CORNING ADVANCED GLASS, LLC 发明人 Park Jaewoo;Lee Yoon Gyu;Kim Do-Hyun;Kim Dongjo;Park Juok;Sohn Insung;Yoon Sangwon;Lee Gunhyo;Lee Yongjin;Jeon Woo-Seok
分类号 H01L29/10;H01L29/12;H01L29/786;C23C14/34;C23C14/08;C23C14/00 主分类号 H01L29/10
代理机构 McDermott Will & Emery LLP 代理人 McDermott Will & Emery LLP
主权项 1. A thin-film transistor comprising: a metal electrode; a zinc oxide-based barrier film comprising zinc oxide doped with indium oxide, and a content of the indium oxide ranges, by weight, from 1 to 50 percent of the zinc oxide-based barrier film; and an oxide semiconductor layer,wherein the zinc oxide-based barrier film is disposed between the metal electrode and the oxide semiconductor layer and the barrier film blocks a material from diffusing out of the metal electrode and into the oxide semiconductor layer.
地址 Gumi-si, Gyeongsangbuk-do KR