发明名称 COMPARISON CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a comparison circuit that can produce a high precision comparative determination result even at high temperature by eliminating an effect of an offset voltage of a comparator in the comparison circuit.SOLUTION: A comparison circuit includes: a comparator including a first input terminal fed with a first input voltage via a first capacitor, a second input terminal fed with a second input voltage via a second capacitor, and an output terminal; a first switch connected at one end to the first input terminal and turned on in a sampling phase to make a voltage of the first input terminal at a voltage of the output terminal; a second switch connected at one end to the second input terminal and turned on in the sampling phase to make a voltage of the second input terminal at a reference voltage; and a third switch turned on in a comparison phase to make voltages of the other end of the first switch and the other end of the second switch equal to each other.
申请公布号 JP2015095727(A) 申请公布日期 2015.05.18
申请号 JP20130233408 申请日期 2013.11.11
申请人 SEIKO INSTRUMENTS INC 发明人 ARIYAMA MINORU
分类号 H03K5/08 主分类号 H03K5/08
代理机构 代理人
主权项
地址