发明名称 CHEMICAL MECHANICAL POLISHING PAD AND CHEMICAL MECHANICAL POLISHING METHOD BY USE THEREOF
摘要 PROBLEM TO BE SOLVED: To provide: a chemical mechanical polishing pad by which all of a higher polishing speed in CMP, the increase in flatness of a face to be polished, and the reduction in polishing defect (i.e. a scratch) can be achieved; and which enables the improvement in dressing property; and a chemical mechanical polishing method by use of such a chemical mechanical polishing pad.SOLUTION: A chemical mechanical polishing pad according to the present invention comprises a polishing layer including a hardened material of epoxy resin. The hardened material of epoxy resin is produced by hardening a composition for a polishing layer which includes (A) an epoxy resin and (B) a stress-lowering agent.
申请公布号 JP2015095582(A) 申请公布日期 2015.05.18
申请号 JP20130234878 申请日期 2013.11.13
申请人 JSR CORP 发明人 YOKOI KATSUTAKA;OKAMOTO TAKAHIRO;NIIMI MASATSUGU;NISHIGUCHI NAOKI;KAMO OSAMU
分类号 H01L21/304;B24B37/24;C09K3/14 主分类号 H01L21/304
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