发明名称 |
CHEMICAL MECHANICAL POLISHING PAD AND CHEMICAL MECHANICAL POLISHING METHOD BY USE THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide: a chemical mechanical polishing pad by which all of a higher polishing speed in CMP, the increase in flatness of a face to be polished, and the reduction in polishing defect (i.e. a scratch) can be achieved; and which enables the improvement in dressing property; and a chemical mechanical polishing method by use of such a chemical mechanical polishing pad.SOLUTION: A chemical mechanical polishing pad according to the present invention comprises a polishing layer including a hardened material of epoxy resin. The hardened material of epoxy resin is produced by hardening a composition for a polishing layer which includes (A) an epoxy resin and (B) a stress-lowering agent. |
申请公布号 |
JP2015095582(A) |
申请公布日期 |
2015.05.18 |
申请号 |
JP20130234878 |
申请日期 |
2013.11.13 |
申请人 |
JSR CORP |
发明人 |
YOKOI KATSUTAKA;OKAMOTO TAKAHIRO;NIIMI MASATSUGU;NISHIGUCHI NAOKI;KAMO OSAMU |
分类号 |
H01L21/304;B24B37/24;C09K3/14 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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