IMAGE PROCESSOR AND IMAGE PROCESSING METHOD

摘要

PROBLEM TO BE SOLVED: To estimate a deflection reflection characteristic in high resolution from a deflection reflection characteristic measured in low resolution.SOLUTION: Deflection reflection characteristic data 203 obtained by measuring an object and unevenness characteristic data 201 in the object are inputted. A high resolution deflection reflection characteristic estimation unit 205 first calculates a normal histogram showing an inclination distribution in a minute region of the surface of the object from the unevenness characteristic data. Then, a deflection reflection characteristic in resolution higher than that of the deflection reflection characteristic data 203 is estimated by deconvolution of the deflection reflection characteristic data 203 and the normal histogram. Thus, a rendering part 206 can perform rendering using a deflection reflection characteristic in high resolution.