接触探针和相关电路，以及用于信号处理的方法;TOUCH PROBE AND RELATIVE CIRCUITS AND METHODS FOR SIGNAL PROCESSING

摘要

探针(100)包括框体(2)、可移动的臂组(3)和用于处理信号的处理电路(30；30')。处理电路能够独立地检测由臂组的机械元件和框体的机械元件之间的配合所界定之接点(13)的状态，亦即，接点的关闭或开启，并在其检测到不超过一个开启的接点时，提供指示探针的停留位置之信号。;用于处理信号的方法使用上述电路以提供指示探针的停留位置之信号。;电路和用于处理信号的方法被有利地实施，用于处理接触探针的输出信号，接触探针系适于在座标量测机和工具机中去检查工件的位置或尺寸。; 30') for processing signals. The processing circuit is able to individually detect the state of contacts (13) defined by the cooperation between mechanical elements of the armset and mechanical elements of the frame, that is the closing or opening of the contacts, and provide a signal indicative of a rest position of the probe when it detects no more than one open contact. ;A method for processing signals uses said circuit in order to provide a signal indicative of a rest position of the probe. ;The circuit and the method for processing signals are advantageously implemented for processing the output signals of a touch probe adapted to check dimensions or position of a workpiece in coordinate measuring machines and machine tools.