| 摘要 |
<p>The subject of the present invention is a method and a system for measuring the geometric or optical structure of an optical component. In particular, the invention relates to a method for measuring the geometric structxire of a component bounded by a first side (10) and a second side (20), said method comprising steps of: (SI) measuring a first signal (MSI) resulting from a first conversion of a first probe signal (PSl), by at least said first side (10); (S2) measuring a second signal (MS2) resulting from a second conversion of a second probe signal (PS2), by at least said second side (20); (S3) determining a third conversion making it possible to convert a first set of coordinates (Rl) associated with the measurement of tlie first signal (MSI) to a second set of coordinates (R2) associated with the measurement of the second signal (MS2); (SIO) estimating said first side (10) using the first signal (MSI), said first simulation and a first cost criterion (VI) quantifying a difference between the estimation (ESI) and the first signal (MSI); and (S20) estimating said second side (20) using the second signal (MS2), said second simulation, said third conversion and a second cost criterion (V2) quantifying a difference between the estimation (ES2) and the second signal (MS2).</p> |
