| 摘要 |
The present invention provides an inspection jig which can improve the accuracy of the positioning of a contact in contact with the substrate. The inspection jig (1) includes: a frame (40); an electrode body (6) having an electrode (7); a conductive contact (5) having a wire form; and a support block (100) which includes a facing surface (2a) where a substrate under a test (A) is mounted by facing the surface, guides one end of the contact (5) to a test point of the substrate under a test (A) which is placed on the facing surface (2a), guides the other end of the contact (5) to the electrode (7), and, being relatively movable with respect to the frame (40) along the moving direction crossing the facing surface (2a). The inspection jig also includes a pressing portion (14) which presses the support block (100) in the direction toward the substrate under a test (A) by placing the support block (100) away from the electrode body (6); and a regulation plate (9) which is extended to the extension direction towards the frame (40) from the support block (100), disposed between the support block (100) and the frame (40), and parallel to the facing surface (2a) while having elasticity, wherein modification for the first direction crossing the extension direction is regulated. |
