发明名称 Thermal Dissipation Through Seal Rings in 3DIC Structure
摘要 A package includes a die, which includes a semiconductor substrate, a plurality of through-vias penetrating through the semiconductor substrate, a seal ring overlapping and connected to the plurality of through-vias, and a plurality of electrical connectors underlying the semiconductor substrate and connected to the seal ring. An interposer is underlying and bonded to the die. The interposer includes a substrate, and a plurality of metal lines over the substrate. The plurality of metal lines is electrically coupled to the plurality of electrical connectors. Each of the plurality metal lines has a first portion overlapped by the first die, and a second portion misaligned with the die. A heat spreader encircles the die and the interposer. A wire includes a first end bonded to one of the plurality of metal lines, and a second end bonded to the heat spreader.
申请公布号 US2015129190(A1) 申请公布日期 2015.05.14
申请号 US201514599834 申请日期 2015.01.19
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Lin Jing-Cheng
分类号 H01L23/367;H01L23/538 主分类号 H01L23/367
代理机构 代理人
主权项 1. A package comprising: a first die comprising a first seal ring comprising a plurality of sides adjacent to edges of the first die; a heat spreader encircling the first die; and a thermal conductive path connecting the heat spreader to the first seal ring, wherein an entirety of the thermal conductive path is formed of metal-containing features.
地址 Hsin-Chu TW