发明名称 |
PLASMA GENERATION AND PULSED PLASMA ETCHING |
摘要 |
One or more plasma etching techniques are provided. Selective plasma etching is achieved by introducing a gas into a chamber containing a photoresist over a substrate, establishing a bias at a frequency to convert the gas to a plasma at the frequency, and using the plasma to etch the photoresist. The frequency controls an electron density of the plasma and by maintaining a low electron density causes free radicals of the plasma to chemically etch the photoresist, rather than physically etching using ion bombardment. A mechanism is thus provided for chemically etching a photoresist under what are typically physical etching conditions. |
申请公布号 |
US2015132971(A1) |
申请公布日期 |
2015.05.14 |
申请号 |
US201314078787 |
申请日期 |
2013.11.13 |
申请人 |
Taiwan Semiconductor Manufacturing Company Limited |
发明人 |
Lin Yu Chao;Chen Chao-Cheng |
分类号 |
H01L21/3065;H01L21/308 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
1. A method for plasma etching, comprising:
treating a photoresist that is over a substrate, the substrate situated between a first electrode and a second electrode in a chamber, the treating comprising:
introducing a first gas into the chamber such that the photoresist is exposed to the first gas;establishing a bias between the first electrode and the second electrode at a frequency using a power supply such that the first gas is converted to plasma at the frequency to etch the photoresist. |
地址 |
Hsin-Chu TW |