发明名称 Method And Apparatus For Mapping And Analyzing Surface Gradients
摘要 An apparatus and method is disclosed for analyzing a surface. An image capturing device (ICD) and a light source may be supported on a frame-like structure fixedly relative to each other. The light source may direct substantially parallel light rays at the surface at an angle β relative to the surface, which are reflected off of the surface as reflected light rays as the light source and the ICD are moved relative to the surface. The ICD has a view axis disposed at an angle a relative to the surface, and operates to capture only light rays that are reflected along angle α, which form an image. The image provides an indication of a characteristic of the surface.
申请公布号 US2015130926(A1) 申请公布日期 2015.05.14
申请号 US201314079343 申请日期 2013.11.13
申请人 Boulder Imaging, Inc. 发明人 SHERIDAN, III Chris R.;JORQUERA Carlos;KULBIDA Jie;ANDREW Colin
分类号 G01N21/88;G01N21/85;G06T7/00 主分类号 G01N21/88
代理机构 代理人
主权项 1. An apparatus for analyzing a surface, the apparatus comprising: an image capturing device and a collimated light source supported fixedly relative to each other, the light source configured to direct substantially parallel light rays at the surface at an angle β relative to the surface, which are reflected off of the surface as reflected light rays, as the image capturing device and collimated light source are moved relative to the surface; the image capturing device having a view axis disposed at an angle α relative to the surface, and the image capturing device being operative to capture substantially only those ones of the reflected light rays that are reflected in accordance with the angle α, which thus form an image; and wherein the image provides an indication of a characteristic of the surface.
地址 Louisville CO US