| 摘要 |
PROBLEM TO BE SOLVED: To perform an operation test of a function for preventing a refresh failure in a semiconductor device that needs to hold information by a refresh operation.SOLUTION: A memory cell array 110 holds count values indicating the number of accesses of word lines. When access to a memory occurs, a counter circuit 140 reads a count value of a word line to be accessed, and counts up it. A write circuit 150 writes the counted-up count value back to the memory cell array 110 as it is and, if an active signal TACT for an operation test is activated, writes a predetermined value (a first value) back to the memory cell array 110. |
