| 发明名称 |
THRESHOLD ESTIMATION USING BIT FLIP COUNTS AND MINIMUMS |
| 摘要 |
A bit flip count is determined for each bin in a plurality of bins, including by: (1) performing a first read on a group of solid state storage cells at a first threshold that corresponds to a lower bound for a given bin and (2) performing a second read on the group of solid state storage cells at a second threshold that corresponds to an upper bound for the given bin. A minimum is determined using the bit flip counts corresponding to the plurality of bins and the minimum is used to estimate an optimal threshold. |
| 申请公布号 |
US2015131376(A1) |
申请公布日期 |
2015.05.14 |
| 申请号 |
US201414480988 |
申请日期 |
2014.09.09 |
| 申请人 |
SK hynix memory solutions inc. |
发明人 |
Tsang Christopher S.;Lee Frederick K.H.;Tang Xiangyu;Wu Zheng;Bellorado Jason |
| 分类号 |
G11C16/34;G11C16/26 |
主分类号 |
G11C16/34 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method for estimating an optimal threshold, comprising:
using a processor to determine a bit flip count for each bin in a plurality of bins, including by: (1) performing a first read on a group of solid state storage cells at a first threshold that corresponds to a lower bound for a given bin and (2) performing a second read on the group of solid state storage cells at a second threshold that corresponds to an upper bound for the given bin; determining a minimum using the bit flip counts corresponding to the plurality of bins; and to using the minimum to estimate an optimal threshold. |
| 地址 |
San Jose CA US |
