发明名称 LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
摘要 A field manipulator to provide high resolution control of position in the XY plane and/or focus control. The field manipulator includes a plate located between the patterning device and the substrate. Control of the XY position is provided by tilting of the plate, while control of the focus position may be provided by localized deformation of the plate. Both adjustments may be performed by one or more actuators that act upon one or more edges of the plate. In an embodiment, two substantially parallel plates are provided and focus control can be provided by changing the spacing between them. A liquid may be provided between the plates which may be temperature controlled to adjust the focus by changing the refractive index of the liquid.
申请公布号 US2015131067(A1) 申请公布日期 2015.05.14
申请号 US201314398047 申请日期 2013.05.07
申请人 ASML NETHERLANDS B.V. 发明人 Baselmans Johannes Jacobus Matheus;Loopstra Erik Roelof
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
主权项 1. A lithographic apparatus comprising: a substrate table constructed to hold a substrate; a projection system configured to project a patterned radiation beam onto a target portion of the substrate, the projection system having an optical axis; and a field manipulator comprising a pair of substantially parallel plates and an actuator configured to act on the plates to adjust the position of the radiation beam in a plane orthogonal to the optical axis, and/or to adjust the focus of the radiation beam.
地址 Veldhoven NL