METHOD AND A DEVICE FOR THE INSPECTION OF SURFACES OF AN EXAMINED OBJECT

摘要

A method and a device for the inspection of surfaces of an examined object includes illuminating a the surface using an illumination unit and capturing an image of the surface using an area image sensor. The captured images are forwarded to an image analysis unit configured to ascertain surface anomalies as defect areas and delimit, if required, the defect areas in a segmentation relative to one another or against the image background, to summarize defect areas belonging together in a regional analysis, to derive characteristic defects from defect areas or defect regions in a feature extraction or both.

主权项

1. A method for the inspection of surfaces of an examined object, comprising the steps of:
calibrating an area image sensor three-dimensionally onto a selected coordinate system; calibrating an illuminating unit three-dimensionally onto the selected coordinate system; illuminating a surface of an object using the calibrated is illuminating unit; capturing images of the illuminated surface using the calibrated area image sensor while the surface is moved relative the calibrated area image sensor; and forwarding the captured images to an image analysis unit configured to ascertain surface anomalies as defect areas in a detection as well as to delimit, if required, the defect areas in a segmentation relative to other defect areas or against an image background, to summarize defect areas belonging together in a regional analysis, to derive characteristic defects from defect areas or defect wherein the step of illuminating includes projecting a pattern is onto an area of the surface of the object, which area is captured by the calibrated area image sensor in the step of capturing; and wherein a position of defined pattern portions of the projected pattern on the surface of the object is determined in the selected coordinate system.