| 摘要 |
The invention relates to a microscopy method for examining a microscopic specimen 50, wherein illuminating light 11 is emitted from a light source 10 onto the specimen. Specimen light 55 coming from the specimen is guided with optical imaging means 40,25 (objective and beam splitter) to a detector unit 30 which may be configured as in figures 7 to 10. The detector unit produces a plurality of specimen recordings, wherein height information for a respective plurality of lateral regions of the specimen is obtained from each specimen recording and wherein the height information of each specimen recording is limited to a respective height measurement range; and the height measurement ranges of different specimen recordings are different from each other, and wherein an overall image is calculated from the specimen recordings. The microscopy method is characterized in that specimen recordings are recorded at such heights that the height measurement ranges of different specimen recordings overlap each other, that common lateral regions are identified in two respective specimen recordings, for which lateral regions height information could be obtained in both specimen recordings, and that a link of the height information of different specimen recordings is determined on the basis of the height information of different specimen recordings for at least one common lateral region. |
