发明名称 重合体、レジスト組成物、及びパターンが形成された基板の製造方法
摘要 <P>PROBLEM TO BE SOLVED: To provide a polymer capable of forming a high-sensitivity resist film and excellent in solvent solubility when it is formed into a resist composition. <P>SOLUTION: The polymer (P) is obtained by radical polymerization and satisfying the following formula (1) P[&alpha;<SB>A</SB>]/P[&alpha;<SB>B</SB>]&le;0.7 when subjected to gel permeation chromatography (GPC). In formula (1), P[&alpha;<SB>A</SB>] is the ratio of the peak area from the peak start molecular weight to the peak top molecular weight to the total polymer peak area when the polymer (P) is subjected to gel permeation chromatography, and P[&alpha;<SB>B</SB>] is the ratio of the peak area from the peak top molecular weight to the peak end molecular weight to the total polymer peak area when polymer (P) is subjected to gel permeation chromatography. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP5716943(B2) 申请公布日期 2015.05.13
申请号 JP20090136168 申请日期 2009.06.05
申请人 三菱レイヨン株式会社 发明人 安田 敦
分类号 C08F2/00;G03F7/039;H01L21/027 主分类号 C08F2/00
代理机构 代理人
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