| 摘要 |
A method includes characterizing the effects of an electric field on a first set of printed wiring boards (PWBs) by testing the first set of PWBs to generate test data, using the test data to determine a dielectric life curve of the first set of PWBs, and based on the dielectric life curve, defining a screening time and a screening voltage to screen for premature failures in a second set of PWBs due to electric fields. |
