| 摘要 |
A solid-state imaging apparatus includes a pixel matrix section, 102, a column signal line, 103, which outputs a pixel signal from the pixel section, a column amplifier circuit, 105, which inverts and amplifies the pixel signal, a bypass circuit, 106, which bypasses the column amplifier circuit, an Analogue to Digital Converter (ADC), 107, and a control unit, 111, which changes an operation mode of the ADC in accordance with the operation of the bypass circuit. In one aspect of the invention the ADC includes a counter and a ramp signal generation circuit which feeds a ramp signal into a comparator for comparison with a reference signal. The control unit changes either the slope of the reference signal or the counting procedure used by the counter when the column amplifier is by-passed by the bypass circuit. Also disclosed is an imaging apparatus which includes a successive approximation ADC and a correlated double sampling (CDS) processing unit. In this aspect the processing of the CDS processing unit is changed between first and second processing modes when the column amplifier is by-passed by the bypass circuit. |
