发明名称 半導体装置及びその製造方法
摘要 <p>According to one embodiment, a semiconductor device includes a gate electrode formed on a substrate with a gate insulation film interposed therebetween, and a source region of a first conductivity type and a drain region of a second conductivity type reverse to the first conductivity type, which are formed so as to hold the gate electrode therebetween within the substrate. The work function of a first region on the source region side within the gate electrode is shifted toward the first conductivity type as compared to the work function of a second region on the drain region side within the gate electrode.</p>
申请公布号 JP5717706(B2) 申请公布日期 2015.05.13
申请号 JP20120213834 申请日期 2012.09.27
申请人 发明人
分类号 H01L21/336;H01L21/265;H01L21/266;H01L21/28;H01L29/423;H01L29/49;H01L29/66;H01L29/78 主分类号 H01L21/336
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