发明名称 Copper foil for printed wiring board, method for producing said copper foil, resin substrate for printed wiring board and printed wiring board
摘要 A copper foil for a printed wiring board, the copper foil being characterized by having, on at least one surface thereof, a roughed layer of the copper foil in which an average diameter at a particle root (D1) corresponding to a distance of 10% of a particle length from the root, is 0.2 μm to 1.0 μm, and a ratio of the particle length (L1) to the average diameter at the particle root (D1) is 15 or less when L1/D1. A copper foil for a printed wiring board, wherein a sum of area covered by holes on an uneven and roughened surface of a resin is 20% or more at a surface of the resin formed by laminating the resin and a copper foil for a printed wiring having a roughened layer and then removing the copper layer by etching. An object of the present invention is to develop a copper foil for a semiconductor package board in which the aforementioned phenomenon of circuit erosion is avoided without deteriorating other properties of the copper foil. In particular, an object of the present invention is to provide a copper foil for a printed wiring board and a producing method thereof, wherein a roughened layer of the copper foil can be improved to enhance the adhesiveness between the copper foil and a resin.
申请公布号 US9028972(B2) 申请公布日期 2015.05.12
申请号 US201113825889 申请日期 2011.09.08
申请人 JX Nippon Mining & Metals Corporation 发明人 Kohiki Michiya;Moriyama Terumasa
分类号 B32B15/20;H05K3/02;H05K3/38;H05K1/09;H05K3/06;C25D1/04;C25D3/38;C25D5/10;C25D5/12;C25D5/16;C25D7/06;C25D11/38;C23C18/16 主分类号 B32B15/20
代理机构 Howson & Howson LLP 代理人 Howson & Howson LLP
主权项 1. A copper foil for a printed wiring board, said copper foil having a roughened layer comprised of needle or rod-shaped particles, wherein on at least one surface of the copper foil, an average diameter at a needle-like or rod-like particle root (D1) corresponding to a distance of 10% of a needle-like or rod-like particle length is 0.2 μm to 1.0 μm, and a ratio of the particle length (L1) to the average diameter at the particle root (D1) is 15 or less when L1/D1, and a ratio of an average diameter at a needle-like or rod-like particle middle (D2) corresponding to a distance of 50% of the particle length to the average diameter at the particle root (D1) is less than 1.51 when D2/D1.
地址 Tokyo JP