发明名称 Semiconductor device and manufacturing method for semiconductor device
摘要 A semiconductor device includes multilayer interconnects and two variable resistance elements (22a, 22b) that are provided among the multilayer interconnects and that include first electrodes (5), second electrodes (10a, 10b), and variable resistance element films (9a, 9b) that are each interposed between first electrodes (5) and respective second electrodes (10a, 10b). Either the first electrodes (5) or the second electrodes (10a, 10b) of the two variable resistance elements (22a, 22b) are unified.
申请公布号 US9029825(B2) 申请公布日期 2015.05.12
申请号 US201113704223 申请日期 2011.06.14
申请人 NEC Corporation 发明人 Tada Munehiro;Miyamura Makoto;Hada Hiromitsu
分类号 H01L47/00;H01L45/00;G11C13/00;H01L23/532;H01L27/10;H01L27/24 主分类号 H01L47/00
代理机构 McGinn IP Law Group, PLLC 代理人 McGinn IP Law Group, PLLC
主权项 1. A semiconductor device, comprising: multilayer interconnects; and two variable resistance elements that are provided among said multilayer interconnects and that include first electrodes, second electrodes, and a variable resistance element film that is interposed between these electrodes, wherein: electrode types of said first electrodes or electrode types of said second electrodes of said two variable resistance elements are unified, said two variable resistance elements are bipolar variable resistance elements and are connected in a series, said two variable resistance elements are made of an electrical element that is provided in a signal path, same-polarity electrodes of said two variable resistance elements are connected together, and in the two unconnected electrodes of said two variable resistance elements, one electrode is an input terminal and the other electrode is an output terminal.
地址 Tokyo JP