发明名称 Non-volatile memory device and method for manufacturing same
摘要 According to an embodiment, a non-volatile memory device includes a memory cell including a semiconductor layer, a charge storage layer provided on the semiconductor layer, and a first insulating film provided between the semiconductor layer and the charge storage layer. The device also includes a first conductive layer provided on the charge storage layer, a second conductive layer provided between the charge storage layer and the first conductive layer, a second insulating film provided between the charge storage layer and the second conductive layer, and a third insulating film provided between the first conductive layer and the second conductive layer.
申请公布号 US9029933(B2) 申请公布日期 2015.05.12
申请号 US201314018751 申请日期 2013.09.05
申请人 Kabushiki Kaisha Toshiba 发明人 Sotome Shinichi;Yamada Kenta;Sakamoto Wataru
分类号 H01L29/788;H01L29/423;H01L29/40;H01L21/28;H01L27/115 主分类号 H01L29/788
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A non-volatile memory device comprising: a memory cell including a semiconductor layer, a charge storage layer provided on the semiconductor layer, and a first insulating film provided between the semiconductor layer and the charge storage layer, the semiconductor layer having a stripe shape extending in a first direction; a first conductive layer provided on the charge storage layer, the first conductive layer extending in a second direction crossing the first direction; a second conductive layer provided between the charge storage layer and the first conductive layer, the second conductive layer extending in the second direction; a second insulating film provided between the charge storage layer and the second conductive layer; and a third insulating film provided between the first conductive layer and the second conductive layer.
地址 Minato-ku JP
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