发明名称 |
Non-volatile memory device and method for manufacturing same |
摘要 |
According to an embodiment, a non-volatile memory device includes a memory cell including a semiconductor layer, a charge storage layer provided on the semiconductor layer, and a first insulating film provided between the semiconductor layer and the charge storage layer. The device also includes a first conductive layer provided on the charge storage layer, a second conductive layer provided between the charge storage layer and the first conductive layer, a second insulating film provided between the charge storage layer and the second conductive layer, and a third insulating film provided between the first conductive layer and the second conductive layer. |
申请公布号 |
US9029933(B2) |
申请公布日期 |
2015.05.12 |
申请号 |
US201314018751 |
申请日期 |
2013.09.05 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
Sotome Shinichi;Yamada Kenta;Sakamoto Wataru |
分类号 |
H01L29/788;H01L29/423;H01L29/40;H01L21/28;H01L27/115 |
主分类号 |
H01L29/788 |
代理机构 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
代理人 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
主权项 |
1. A non-volatile memory device comprising:
a memory cell including a semiconductor layer, a charge storage layer provided on the semiconductor layer, and a first insulating film provided between the semiconductor layer and the charge storage layer, the semiconductor layer having a stripe shape extending in a first direction; a first conductive layer provided on the charge storage layer, the first conductive layer extending in a second direction crossing the first direction; a second conductive layer provided between the charge storage layer and the first conductive layer, the second conductive layer extending in the second direction; a second insulating film provided between the charge storage layer and the second conductive layer; and a third insulating film provided between the first conductive layer and the second conductive layer. |
地址 |
Minato-ku JP |