On die thermal sensor of semiconductor memory device

摘要

An on die thermal sensor (ODTS) of a semiconductor memory device includes a high voltage generating unit for generating a high voltage having a voltage level higher than that of a power supply voltage of the semiconductor memory device; and a thermal information output unit for sensing and outputting a temperature as a thermal information code, wherein the thermal information output unit uses the high voltage as its driving voltage.

主权项

1. An on die thermal sensor (ODTS) of a semiconductor memory device, comprising:
a high voltage generator that generates a high voltage having a voltage level higher than that of a power supply voltage; and a thermal information output unit for sensing a temperature of the semiconductor memory device which uses the power supply voltage and outputting the sensed temperature as a thermal information code by using the high voltage, wherein the thermal information output unit uses the high voltage as its driving voltage, wherein the thermal information output unit includes: a thermal sensor for detecting temperature variation of the semiconductor memory device to output a first comparing voltage, which is corresponding to the sensed temperature with the ratio of 1:1 and used in outputting the thermal information code, wherein the thermal sensor uses the high voltage as its driving voltage to increase a variable voltage level of the first comparing voltage.