发明名称 Nonvolatile memory device and method for fabricating the same
摘要 A nonvolatile memory device includes a floating gate formed over a semiconductor substrate, an insulator formed on a first sidewall of the floating gate, a dielectric layer formed on a second sidewall and an upper surface of the floating gate, and a control gate formed over the dielectric layer.
申请公布号 US9029935(B2) 申请公布日期 2015.05.12
申请号 US201414323809 申请日期 2014.07.03
申请人 SK Hynix Inc. 发明人 Lee Nam-Jae
分类号 H01L27/115;H01L21/762;H01L29/423 主分类号 H01L27/115
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A nonvolatile memory device comprising: a plurality of floating gates formed over a substrate and isolated from each other by a first trench and a second trench that are alternately provided between the plurality of floating gates, wherein the second trench having a smaller width than the first trench; a first isolation layer to partially gap-fill the first trench; a second isolation layer gap-filling the second trench; a dielectric layer formed on the entire surface of the semiconductor substrate including the first and second isolation layers and the floating gates; and a control gate formed over the dielectric layer to gap-fill the first trench, wherein the plurality of floating gates have a same critical dimension, and spaces which are alternately provided between the plurality of floating gates, have a different critical dimension.
地址 Gyeonggi-do KR