发明名称 |
Nonvolatile memory device and method for fabricating the same |
摘要 |
A nonvolatile memory device includes a floating gate formed over a semiconductor substrate, an insulator formed on a first sidewall of the floating gate, a dielectric layer formed on a second sidewall and an upper surface of the floating gate, and a control gate formed over the dielectric layer. |
申请公布号 |
US9029935(B2) |
申请公布日期 |
2015.05.12 |
申请号 |
US201414323809 |
申请日期 |
2014.07.03 |
申请人 |
SK Hynix Inc. |
发明人 |
Lee Nam-Jae |
分类号 |
H01L27/115;H01L21/762;H01L29/423 |
主分类号 |
H01L27/115 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A nonvolatile memory device comprising:
a plurality of floating gates formed over a substrate and isolated from each other by a first trench and a second trench that are alternately provided between the plurality of floating gates, wherein the second trench having a smaller width than the first trench; a first isolation layer to partially gap-fill the first trench; a second isolation layer gap-filling the second trench; a dielectric layer formed on the entire surface of the semiconductor substrate including the first and second isolation layers and the floating gates; and a control gate formed over the dielectric layer to gap-fill the first trench, wherein the plurality of floating gates have a same critical dimension, and spaces which are alternately provided between the plurality of floating gates, have a different critical dimension. |
地址 |
Gyeonggi-do KR |