| 发明名称 | Electrode foil and electronic device | ||
| 摘要 | There is provided an electrode foil, which can show superior light scattering, while preventing short circuit between electrodes. The electrode foil of the present invention comprises a metal foil having a thickness of from 1 μm to 250 μm, wherein the electrode foil comprises, on at least one outermost surface thereof, a light-scattering surface having a Pv/Pp ratio of 2.0 or higher, wherein the Pv/Pp ratio is a ratio of a maximum profile valley depth Pv of a profile curve to a maximum profile peak height Pp of the profile curve as measured in a rectangular area of 181 μm×136 μm in accordance with JIS B 0601-2001. | ||
| 申请公布号 | US9029885(B2) | 申请公布日期 | 2015.05.12 |
| 申请号 | US201213981804 | 申请日期 | 2012.12.26 |
| 申请人 | Mitsui Mining & Smelting Co., Ltd. | 发明人 | Matsuura Yoshinori;Kitajima Nozomu;Nakamura Toshimi;Myoi Masaharu |
| 分类号 | H01L33/00;H01L33/38;H05B33/26;H01L31/0224;H01L51/00;H01L31/0392;H01L31/056;H01L33/40;H01L33/42 | 主分类号 | H01L33/00 |
| 代理机构 | The Webb Law Firm | 代理人 | The Webb Law Firm |
| 主权项 | 1. An electrode foil comprising a metal foil having a thickness of from 1 μm to 250 μm, wherein the electrode foil comprises, on at least one outermost surface thereof, a light-scattering surface having a Pv/Pp ratio of 2.0 or higher, wherein the Pv/Pp ratio is a ratio of a maximum profile valley depth Pv of a profile curve to a maximum profile peak height Pp of the profile curve as measured in a rectangular area of 181 μm×136 μm in accordance with JIS B 0601-2001, and wherein the light-scattering surface has an arithmetic average roughness Ra of 60 nm or less as measured in accordance with JIS B 0601-2001. | ||
| 地址 | Tokyo JP | ||