发明名称 |
Integrated circuits and methods for fabricating integrated circuits with improved silicide contacts |
摘要 |
Integrated circuits and methods for fabricating integrated circuits are provided herein. In an embodiment, a method for fabricating an integrated circuit includes forming over a semiconductor substrate a gate structure. The method further includes depositing a non-conformal spacer material around the gate structure. A protection mask is formed over the non-conformal spacer material. The method etches the non-conformal spacer material and protection mask to form a salicidation spacer. Further, a self-aligned silicide contact is formed adjacent the salicidation spacer. |
申请公布号 |
US9029214(B2) |
申请公布日期 |
2015.05.12 |
申请号 |
US201313740974 |
申请日期 |
2013.01.14 |
申请人 |
GLOBALFOUNDRIES, Inc. |
发明人 |
Hoentschel Jan;Flachowsky Stefan;Sassiat Nicolas;Yan Ran |
分类号 |
H01L21/8238;H01L29/66;H01L29/78 |
主分类号 |
H01L21/8238 |
代理机构 |
Ingrassia Fisher & Lorenz, P.C. |
代理人 |
Ingrassia Fisher & Lorenz, P.C. |
主权项 |
1. A method for fabricating an integrated circuit comprising:
forming a gate structure overlying a semiconductor substrate; forming a conformal spacer around the gate structure; performing an ion implantation into the semiconductor substrate using the conformal spacer as a mask; removing the conformal spacer; after removing the conformal spacer, depositing a non-conformal spacer material around the gate structure; forming a protection mask over the non-conformal spacer material, wherein the non-conformal spacer material encapsulates the gate structure and prevents contact between the protection mask and the gate structure; etching the non-conformal spacer material and protection mask to form a salicidation spacer; and forming a self-aligned silicide contact adjacent the salicidation spacer. |
地址 |
Grand Cayman KY |