发明名称 |
Methods of forming epitaxial structures |
摘要 |
An embodiment is a method. A first III-V compound semiconductor is epitaxially grown in a trench on a substrate, and the epitaxial growth is performed in a chamber. The first III-V compound semiconductor has a first surface comprising a facet. After the epitaxial growth, the first surface of the first III-V compound semiconductor is etched to form an altered surface of the first III-V compound semiconductor. Etching the first surface is performed in the chamber in situ. A second III-V compound semiconductor is epitaxially grown on the altered surface of the first III-V compound semiconductor. The epitaxial growth of the first III-V compound semiconductor may be performed in a MOCVD chamber, and the etch may use an HCl gas. Structures resulting from methods are also disclosed. |
申请公布号 |
US9029246(B2) |
申请公布日期 |
2015.05.12 |
申请号 |
US201313954659 |
申请日期 |
2013.07.30 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Chen Meng-Ku;Lin Hung-Ta;Tsai Pang-Yen;Chang Huicheng |
分类号 |
H01L21/20;H01L21/36;H01L29/06;H01L21/762 |
主分类号 |
H01L21/20 |
代理机构 |
Slater & Matsil, L.L.P. |
代理人 |
Slater & Matsil, L.L.P. |
主权项 |
1. A method comprising:
forming substrate with a trench, the trench being defined by an isolation region; epitaxially growing a first III-V compound semiconductor in the trench, the first III-V compound semiconductor having a first surface; etching the first surface of the first III-V compound semiconductor to form a modified surface of the first III-V compound semiconductor, the modified surface being below an upper portion of the isolation region; and epitaxially growing a second III-V compound semiconductor on the modified surface of the first III-V compound semiconductor. |
地址 |
Hsin-Chu TW |