发明名称 Methods of forming epitaxial structures
摘要 An embodiment is a method. A first III-V compound semiconductor is epitaxially grown in a trench on a substrate, and the epitaxial growth is performed in a chamber. The first III-V compound semiconductor has a first surface comprising a facet. After the epitaxial growth, the first surface of the first III-V compound semiconductor is etched to form an altered surface of the first III-V compound semiconductor. Etching the first surface is performed in the chamber in situ. A second III-V compound semiconductor is epitaxially grown on the altered surface of the first III-V compound semiconductor. The epitaxial growth of the first III-V compound semiconductor may be performed in a MOCVD chamber, and the etch may use an HCl gas. Structures resulting from methods are also disclosed.
申请公布号 US9029246(B2) 申请公布日期 2015.05.12
申请号 US201313954659 申请日期 2013.07.30
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Chen Meng-Ku;Lin Hung-Ta;Tsai Pang-Yen;Chang Huicheng
分类号 H01L21/20;H01L21/36;H01L29/06;H01L21/762 主分类号 H01L21/20
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A method comprising: forming substrate with a trench, the trench being defined by an isolation region; epitaxially growing a first III-V compound semiconductor in the trench, the first III-V compound semiconductor having a first surface; etching the first surface of the first III-V compound semiconductor to form a modified surface of the first III-V compound semiconductor, the modified surface being below an upper portion of the isolation region; and epitaxially growing a second III-V compound semiconductor on the modified surface of the first III-V compound semiconductor.
地址 Hsin-Chu TW