发明名称 X-ray beam system offering 1D and 2D beams
摘要 A system for analyzing a sample is provided. The system includes an optical system capable of providing a one-dimensional beam and a two-dimensional beam. The system may include a beam selection device to select between providing a one-dimensional x-ray beam to the sample in a one-dimensional operation mode and a two-dimensional x-ray beam to the sample in a two-dimensional operation mode.
申请公布号 US9031203(B2) 申请公布日期 2015.05.12
申请号 US201313912364 申请日期 2013.06.07
申请人 Rigaku Innovative Technologies, Inc. 发明人 Jiang Licai;Verman Boris
分类号 G21K1/06;G01N23/201 主分类号 G21K1/06
代理机构 Brinks Gilson & Lione 代理人 Brinks Gilson & Lione
主权项 1. A dual mode x-ray beam system capable of providing both a one-dimensional beam and a two-dimensional beam comprising: an x-ray source; an optical system comprising two reflective x-ray optics such that a two-dimensional part of the optical system is formed by a first reflective x-ray optic and a first portion of the second reflective x-ray optica one-dimensional part of the optical system formed by a different portion of the second reflective x-ray optic;a first portion of the x-rays emitted from the x-ray source is reflected by the two-dimensional part of the optical system and forms a two-dimensional beam;a second portion of the x-rays emitted from the x-ray source is reflected by the one-dimensional part of the optical system and forms a one-dimensional beam.
地址 Auburn Hills MI US