发明名称 |
X-ray beam system offering 1D and 2D beams |
摘要 |
A system for analyzing a sample is provided. The system includes an optical system capable of providing a one-dimensional beam and a two-dimensional beam. The system may include a beam selection device to select between providing a one-dimensional x-ray beam to the sample in a one-dimensional operation mode and a two-dimensional x-ray beam to the sample in a two-dimensional operation mode. |
申请公布号 |
US9031203(B2) |
申请公布日期 |
2015.05.12 |
申请号 |
US201313912364 |
申请日期 |
2013.06.07 |
申请人 |
Rigaku Innovative Technologies, Inc. |
发明人 |
Jiang Licai;Verman Boris |
分类号 |
G21K1/06;G01N23/201 |
主分类号 |
G21K1/06 |
代理机构 |
Brinks Gilson & Lione |
代理人 |
Brinks Gilson & Lione |
主权项 |
1. A dual mode x-ray beam system capable of providing both a one-dimensional beam and a two-dimensional beam comprising:
an x-ray source; an optical system comprising two reflective x-ray optics such that
a two-dimensional part of the optical system is formed by a first reflective x-ray optic and a first portion of the second reflective x-ray optica one-dimensional part of the optical system formed by a different portion of the second reflective x-ray optic;a first portion of the x-rays emitted from the x-ray source is reflected by the two-dimensional part of the optical system and forms a two-dimensional beam;a second portion of the x-rays emitted from the x-ray source is reflected by the one-dimensional part of the optical system and forms a one-dimensional beam. |
地址 |
Auburn Hills MI US |