Low contamination scanner for GCIB system

摘要

Disclosed are an apparatus, system, and method for scanning a substrate or other workpiece through a gas-cluster ion beam (GCIB), or any other type of ion beam. The workpiece scanning apparatus is configured to receive and hold a substrate for irradiation by the GCIB and to scan it through the GCIB in two directions using two movements: a reciprocating fast-scan movement, and a slow-scan movement. The slow-scan movement is actuated using a servo motor and a belt drive system, the belt drive system being configured to reduce the failure rate of the workpiece scanning apparatus. The apparatus further includes shields and other features for reducing process contamination resulting from scattering of the GCIB from the scanning apparatus.

主权项

1. An apparatus for scanning a workpiece through an ion beam, comprising:
an elongated member having a workpiece chuck at a first end, for mounting a workpiece to be processed; a rotational mechanism mounting the elongated member at a point of rotation located on the elongated member away from the first end, and adapted to repetitively scan the workpiece through the ion beam along an arcuate path; a slow-scan mechanism suspending the elongated member and rotational mechanism, and adapted to cause movement of the rotational mechanism and the elongated member, to cause different portions of the workpiece to pass through the ion beam, wherein the elongated member comprises at least one opening located between the first end and the point of rotation, and facing the incoming ion beam, the at least one opening allowing passage of the ion beam through the elongated member.