发明名称 |
Phase-stabilized thin films, structures and devices including the thin films, and methods of forming same |
摘要 |
Nitrogen-containing phase-stabilized films, methods of forming phase-stabilized films, and structures and devices including the phase-stabilized films are disclosed. The phase-stabilized films include a matrix material and a phase stabilizer, which provides a morphologically stabilizing effect to a matrix material within the films. The phase-stabilized films may be used as, for example, gate electrodes and similar films in microelectronic devices. |
申请公布号 |
US9029253(B2) |
申请公布日期 |
2015.05.12 |
申请号 |
US201313874708 |
申请日期 |
2013.05.01 |
申请人 |
ASM IP Holding B.V. |
发明人 |
Milligan Robert Brennan;Alokozai Fred |
分类号 |
H01L21/20;H01L29/49;H01L29/40;H01L21/28;H01L21/44;H01L29/51;H01L21/67 |
主分类号 |
H01L21/20 |
代理机构 |
Snell & Wilmer LLP |
代理人 |
Snell & Wilmer LLP |
主权项 |
1. A cyclic deposition method of forming a phase-stabilized nitrogen-containing film comprising a solid solution having a stoichiometric ratio of MmzxMs(z-x)X, where Mmzx and Ms(z-x) are transition metals, one belonging to Group V, another belonging either to Group IV or to Group VI of Periodic Table, x varies in a range from greater than 0 to less than 1 and z varies in a range from greater than x to 1, wherein the phase-stabilized nitrogen-containing film comprises a matrix material and a phase stabilizer within the solid solution, wherein the phase-stabilized nitrogen-containing film is formed on a substrate within a reactor by exposing the substrate to a pulse of a matrix material precursor and a phase stabilizer precursor, removing an unreacted matrix material precursor and an unreacted phase stabilizer precursor from the reactor, exposing the substrate to a pulse of a nitrogen-containing reactant, and removing an unreacted nitrogen-containing reactant from the reactor, and wherein the phase stabilizer stabilizes the matrix material in a solution phase that is different from a native phase of the matrix material that would be formed under identical film formation conditions. |
地址 |
Almere NL |