发明名称 Interconnect structures comprising flexible buffer layers
摘要 A structure includes a substrate, a low-k dielectric layer over the substrate, and a conductive barrier layer extending into the low-k dielectric layer. The conductive barrier layer includes a sidewall portion. A metal line in the low-k dielectric layer adjoins the conductive barrier layer. An organic buffer layer is between the sidewall portion of the conductive barrier layer and the low-k dielectric layer.
申请公布号 US9030013(B2) 申请公布日期 2015.05.12
申请号 US201213624766 申请日期 2012.09.21
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Peng Chao-Hsien;Huang Hsin-Yen;Lee Hsiang-Huan;Shue Shau-Lin
分类号 H01L23/48;H01L23/52;H01L21/768;H01L23/532 主分类号 H01L23/48
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A structure comprising: a substrate; a first metal line over the substrate; a low-k dielectric layer over the first metal line; a conductive barrier layer extending into the low-k dielectric layer, wherein the conductive barrier layer comprises a sidewall portion, and a bottom portion underlying and connected to the sidewall portion, and wherein a portion of the conductive barrier layer comprises a bottom surface in contact with a top surface of the first metal line; a second metal line adjoining the conductive barrier layer and in the low-k dielectric layer; and an organic buffer layer comprising: a first portion between the sidewall portion of the conductive barrier layer and the low-k dielectric layer; anda second portion underlying and in contact with the bottom portion of the conductive barrier layer.
地址 Hsin-Chu TW