发明名称 |
Interconnect structures comprising flexible buffer layers |
摘要 |
A structure includes a substrate, a low-k dielectric layer over the substrate, and a conductive barrier layer extending into the low-k dielectric layer. The conductive barrier layer includes a sidewall portion. A metal line in the low-k dielectric layer adjoins the conductive barrier layer. An organic buffer layer is between the sidewall portion of the conductive barrier layer and the low-k dielectric layer. |
申请公布号 |
US9030013(B2) |
申请公布日期 |
2015.05.12 |
申请号 |
US201213624766 |
申请日期 |
2012.09.21 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Peng Chao-Hsien;Huang Hsin-Yen;Lee Hsiang-Huan;Shue Shau-Lin |
分类号 |
H01L23/48;H01L23/52;H01L21/768;H01L23/532 |
主分类号 |
H01L23/48 |
代理机构 |
Slater & Matsil, L.L.P. |
代理人 |
Slater & Matsil, L.L.P. |
主权项 |
1. A structure comprising:
a substrate; a first metal line over the substrate; a low-k dielectric layer over the first metal line; a conductive barrier layer extending into the low-k dielectric layer, wherein the conductive barrier layer comprises a sidewall portion, and a bottom portion underlying and connected to the sidewall portion, and wherein a portion of the conductive barrier layer comprises a bottom surface in contact with a top surface of the first metal line; a second metal line adjoining the conductive barrier layer and in the low-k dielectric layer; and an organic buffer layer comprising:
a first portion between the sidewall portion of the conductive barrier layer and the low-k dielectric layer; anda second portion underlying and in contact with the bottom portion of the conductive barrier layer. |
地址 |
Hsin-Chu TW |