发明名称 EXTERNAL SHORT CIRCUIT TEST DEVICE AND EXTERNAL SHORT CIRCUIT TEST
摘要 PROBLEM TO BE SOLVED: To provide an external short circuit test device and an external short circuit test method capable of preventing such a situation that a contact is damaged or arc is generated therefrom in opening and closing means, and a test cannot be ended.SOLUTION: An external short circuit test device 10 includes an external short circuit 11 for causing external short circuit of a battery 20 as a test object. The external short circuit 11 has a battery installing section 21 for installing the battery 20, first opening and closing means 30 for opening and closing the external short circuit 11, and external resistance increasing means 40 for increasing the external resistance of a battery in the external short circuit 11. These battery installing section 21, first opening and closing means 30, and external resistance increasing means 40 are connected in series with each other.
申请公布号 JP2015090745(A) 申请公布日期 2015.05.11
申请号 JP20130229234 申请日期 2013.11.05
申请人 ESPEC CORP 发明人 HIRATA TAKUYA
分类号 H01M10/04;H01M10/48 主分类号 H01M10/04
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