发明名称 MEASURING APPARATUS FOR LINEWIDTH AND DEPTH OF FINE PATTERN BY USING OPTICAL FIBER AND MEASURING METHOD OF THE SAME
摘要 The present invention relates to an optical device and a surface pattern measuring apparatus. The invention comprises: a light source part flashing out coherent light in broadband; a first optical fiber coupler, which receives incident light from the light source part into its inlet part and separating a first incident light and a second incident light to a first output part and a second output part, respectively; a first terminal receiving the second incident light from the second output part of the first optical fiber coupler; a second terminal receiving the first incident light from the first terminal to the second terminal as a sample; an optical circulator including a third terminal, which receives a reflective light reflected from the sample and outputs it; a first input part, which receives the first incident light from the first output part of the first optical fiber coupler; a second input part receiving the reflective light; a second optical fiber coupler including an output part, which outputs the combined second incident light and the reflective light; and a spectrum analyzer, which receives the output light from the second optical fiber coupler and measures the strength of the interference light according to the wavelength.
申请公布号 KR20150048971(A) 申请公布日期 2015.05.11
申请号 KR20130128738 申请日期 2013.10.28
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE 发明人 JIN, JONG HAN;KIM, JAE WAN;KIM, JONG AHN;KANG, CHU SHIK
分类号 G01B9/02;G01B11/02;G01B11/22;H01L21/66 主分类号 G01B9/02
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