发明名称 |
MEASURING APPARATUS FOR LINEWIDTH AND DEPTH OF FINE PATTERN BY USING OPTICAL FIBER AND MEASURING METHOD OF THE SAME |
摘要 |
The present invention relates to an optical device and a surface pattern measuring apparatus. The invention comprises: a light source part flashing out coherent light in broadband; a first optical fiber coupler, which receives incident light from the light source part into its inlet part and separating a first incident light and a second incident light to a first output part and a second output part, respectively; a first terminal receiving the second incident light from the second output part of the first optical fiber coupler; a second terminal receiving the first incident light from the first terminal to the second terminal as a sample; an optical circulator including a third terminal, which receives a reflective light reflected from the sample and outputs it; a first input part, which receives the first incident light from the first output part of the first optical fiber coupler; a second input part receiving the reflective light; a second optical fiber coupler including an output part, which outputs the combined second incident light and the reflective light; and a spectrum analyzer, which receives the output light from the second optical fiber coupler and measures the strength of the interference light according to the wavelength. |
申请公布号 |
KR20150048971(A) |
申请公布日期 |
2015.05.11 |
申请号 |
KR20130128738 |
申请日期 |
2013.10.28 |
申请人 |
KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE |
发明人 |
JIN, JONG HAN;KIM, JAE WAN;KIM, JONG AHN;KANG, CHU SHIK |
分类号 |
G01B9/02;G01B11/02;G01B11/22;H01L21/66 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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