发明名称 |
METHOD OF DEFLECTING CHARGED PARTICLE BEAMS USING FLAT SILICON PLATE |
摘要 |
FIELD: physics.SUBSTANCE: invention relates to acceleration engineering. The method of deflecting charged particle beams using a flat silicon plate is based on using the three-dimensional reflection phenomenon. Bending of successive silicon strips on the surface of a plate is achieved through internal stress in the crystal material as a result of the Twyman effect and not through external torque. The silicon plate has a thick flat substrate, owing to which more accurate alignment of the bent silicon strips and better effectiveness of deflecting the beam than in a device with bending of separate strips using a mechanical holder are achieved.EFFECT: high efficiency of bending particle beams.5 dwg |
申请公布号 |
RU2550142(C2) |
申请公布日期 |
2015.05.10 |
申请号 |
RU20120143438 |
申请日期 |
2012.10.10 |
申请人 |
FEDERAL'NOE GOSUDARSTVENNOE BJUDZHETNOE UCHREZHDENIE "GOSUDARSTVENNYJ NAUCHNYJ TSENTR ROSSIJSKOJ FEDERATSII-INSTITUT FIZIKI VYSOKIKH EHNERGIJ" |
发明人 |
AFONIN ALEKSANDR GAVRILOVICH;BARANOV VLADIMIR TIMOFEEVICH;CHESNOKOV JURIJ ANDREEVICH;SANDOMIRSKIJ JURIJ EVGEN'EVICH;JAZYNIN IGOR' ANDREEVICH |
分类号 |
H05H13/04;G21K1/00 |
主分类号 |
H05H13/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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