| 摘要 |
FIELD: measurement equipment.SUBSTANCE: invention relates to a metal tip for use in a scanning probe microscope and also to the method of its manufacturing. A tip (1) has axial length (l), radial length (d), sharpened part (B), which stretches in axial direction from a part with maximum axial length (5) to an atomically sharp end (9), and a blunt part (A), which stretches in axial direction from a part with maximum axial length (5) to the blunt end (7). The axial length of the sharpened part (B) is more than in the blunt part (A). The metal tip (1) has weight of 10 mcg or less.EFFECT: improved quality of a probe sensor.15 cl, 5 dwg |
