发明名称 半導体装置
摘要 A semiconductor device includes a semiconductor layer stack 13 formed on a substrate 11 and having a channel region, a first electrode 16A and a second electrode 16B formed spaced apart from each other on the semiconductor layer stack 13, a first gate electrode 18A formed between the first electrode 16A and the second electrode 16B, and a second gate electrode 18B formed between the first gate electrode 18A and the second electrode 16B. A first control layer 19A having a p-type conductivity is formed between the semiconductor layer stack 13 and the first gate electrode 18A.
申请公布号 JP5715184(B2) 申请公布日期 2015.05.07
申请号 JP20130100007 申请日期 2013.05.10
申请人 パナソニック株式会社 发明人 森田 竜夫;柳原 学;石田 秀俊;上本 康裕;上野 弘明;田中 毅;上田 大助
分类号 H01L21/337;H01L21/338;H01L27/098;H01L29/778;H01L29/808;H01L29/812;H03K17/687 主分类号 H01L21/337
代理机构 代理人
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